Spaceborne Bistatic SAR: a Cost-Effective Tool to Enable New Applications and Enhance Existing Missions
- Paper number
IAC-04-IAA.4.11.6.06
- Author
Prof. Marco D Errico, Seconda Universita di Napoli, Italy
- Year
2004
- Abstract
Single Event Transient (SET) in integrated circuits induced by the charged particles in space environment is one of the factors that result in the malfunction of electronic system on board satellites. The SET scaling of some liner circuits has been carried out using pulsed laser beam that has been focused at micrometers in diameter, and test samples is operational amplifier LM124 and voltage comparator LM139 that adopted in satellite electronic system. Based on experimental investigation utilizing pulsed laser beam at wavelength of 1079 nanometer, the test method for SET has been suggested. The influence of partial and input voltage condition on single event transient is studied experimentally, and the results indicate that the occurrence number of SET induced by pulsed laser beam get more ones with increase of circuit’s partial and input voltage in some irradiation positions located in chip of tested integrated circuits. The experimental results for LM139 devices also indicates that the sensitivity of SET decreases along with the enhance of the ΔVi in evidence. The impact of pulsed laser energy on current pulse wave shape of SET has been investigated, and the result indicates that the attitude and breadth of current pulse induced by pulsed laser beam increased with the energy of laser beam. Based on the calculation of equivalent Liner Energy Transfer (LET) of heavy ion for pulsed laser energy, the equivalent properties of single event transient in operational amplifier LM124 and voltage comparator LM139 induced by heavy ion and pulsed laser has been analyzed.
- Abstract document
- Manuscript document
IAC-04-IAA.4.11.6.06.pdf (🔒 authorized access only).
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