Study of spacecraft surface charging with different secondary electron emission of dielectric
- Paper number
IAC-13,D5,3,11,x20123
- Author
Mr. Yifeng Chen, China Aerospace Science and Technology Corporation (CASC), China
- Year
2013
- Abstract
A PIC(particle-in- cell) model is applied to investigate the surface potential with different secondary electron emission (SEE) of dielectric, and the surface potential is measured under 20-30 keV electron irradiation with the fluence of 1nA/cm2. The results indicate that the surface potential depends on the SEE of dielectric strongly. Furthmore, the surface potential is observed to be larger at higher projectile energy.
- Abstract document
- Manuscript document
IAC-13,D5,3,11,x20123.pdf (🔒 authorized access only).
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