GC-MS and IR spectrometry analyses for component identification of materials outgassing contamination of spacecraft
- Paper number
IAC-15,C2,6,12,x27556
- Author
Dr. Zi-long Jiao, Beijing Institute of Spacecraft Environment Engineering, China
- Coauthor
Dr. Lixiang Jiang, Beijing institute of satellite environment engineering, China
- Coauthor
Prof.Dr. Zizheng GONG, China Academy of Space Technology (CAST), China
- Coauthor
Dr. Huang Jianguo, Center of Spacecraft Assembly Integration and Test,CAST, China
- Coauthor
Mr. Ji-peng Sun, China
- Coauthor
Dr. Yunfei Zhu, China
- Year
2015
- Abstract
The non-metallic materials on spacecraft can severely outgass in thermal vacuum environment, then cause contamination effects to optical systems, thermal control systems and other systems, resulting degradation of performance, even lost of function. For effective control of contamination, we need to identify component of molecular contaminant and find the source of that component. We have created qualitive and quantitive methods of gas chromatography - mass spectrometry (GC-MS) for component identification. By using these methods, we have identified the component for severely contaminated solar array in thermal vacuum test, which is methylphenylsilicone, and the source material, which is solar cell adhesive; and we have found that the quantities of surface contamination of OSR were from 2e-7g/cm2 to 4e-7g/cm2. We have also created IR spectrometry method for component identification for its convenient sampling method compared to GC-MS. At the end of this article, the drawbacks of GC-MS and IR spectrometry methods are discussed.
- Abstract document
- Manuscript document
IAC-15,C2,6,12,x27556.pdf (🔒 authorized access only).
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