research on the optimum scrubbing strategy for space used sram-based fpga
- Paper number
IAC-15,D1,2,4,x29202
- Author
Mr. Fan Zhang, Beijing Microelectronics Technology Institute, China
- Coauthor
Dr. Yuanfu Zhao, Beijing Microelectronics Technology Institute, China
- Year
2015
- Abstract
Static-RAM (SRAM)-based Field Programmable Gate Arrays (FPGAs), with their great flexibility, abundant resources and increasingly diversified functions, have been extensively applied in space electronic systems. However, the undesirable thing is the severe hazard to SRAM-based FPGAs caused by SEU(Single event upset). Scrubbing is an effective SEU mitigation technique to reload the memory array of SRAM-based FPGAs. Scrubbing is usually applied together with TMR(triple modular redundancy),which can provide significant fault-tolerance in SRAM-based FPGAs. A variety of strategies can be adopted in scrubbing, including blind scrubbing, readback verification scrubbing, self-scrubbing, JTAG scrubbing, parallel port scrubbing, etc. It is necessary to find out the strategy with the highest efficiency and reliability for space missions. We designed the scrubbing experiment system to implement all strategies mentioned above and detected their scrubbing validity. With the high-energy ion experiments on the ground, we confirmed the following phenomenon :(1) The higher the scrubbing frequency is, the better the effect will be and the securer the FPGA program will be. (2) With the same scrubbing frequency, the effect of readback verification scrubbing is consistent with that of blind scrubbing.(3)The self-scrubbing has the highest risks.(4)Compared with parallel port scrubbing, JTAG scrubbing is more reliable. Therefore, we drew the conclusion that the most suitable strategy for space mission is to implement blind scrubbing with the highest possible frequency via port JTAG.
- Abstract document
- Manuscript document
IAC-15,D1,2,4,x29202.pdf (🔒 authorized access only).
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