Paper information
- Paper code
- Order
5
- Title
Reliability of MEMS components in harsh environments: concurrent temperature cycling and vibration testing
- abstract
- Session
3. Space Environment and Effects on Space Missions
- symposium
D5. 53rd IAA SYMPOSIUM ON SAFETY, QUALITY AND KNOWLEDGE MANAGEMENT IN SPACE ACTIVITIES
- congress
IAC-20
- Type of presentation
oral
Mr. Maxime Auchlin, Ecole Polytechnique Fédérale de Lausanne (EPFL), Swiss Space Center (SSC), Switzerland
Mr. Octavian Buiu, IMT, Romania;
Dr. Octavian-Narcis Ionescu, Romania;
Mr. Mihai Gologanu, IMT, Romania;
Mr. Laurent Marchand, ESA, The Netherlands;
Prof. Volker Gass, Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland;
Dr. Olha Sereda, CSEM – Centre Suisse d’Electronique et de Microtechnique SA, Switzerland;