Large Structure Determination of Residual Stress
- Paper number
IAC-07-C2.I.12
- Author
Mr. Jingyun Li, China Aerospace Science and Technology Corporation, China
- Year
2007
- Abstract
Various stress is a component process defects such as cracking and deformation of the reasons for the processing, will affect the residual stress components static strength, fatigue, the shape and size of the stress corrosion resistance and stability. A member of the residual stress distribution is the size and designers, which is created by users on issues of common concern. This paper is based on the principle of x-ray diffraction residual stress determination. When certain wavelengths of x-rays with a bouquet of crystal,in a certain sense,arising from the reflection of the x-ray intensity maximal, it is an x-ray diffraction. Determination of stress, x-ray has a different point of view into account polycrystalline materials. So that the crystalline orientation of the corresponding change. Each corresponding to the diffraction angle were measured. For the same clan crystal, when the material there is no stress, every position on the crystal surface spacing equal. When stress exists, with crystal diffraction surface spacing changes will be changed, thus shifting the diffraction angle should be followed.Obviously the higher the stress, even more migration.
- Abstract document